"The booklet presents curated real-world good practice examples that help translate our strategy into concrete actions, and in turn, into the design of education and training programmes that will contribute to skill, upskill, or reskill individuals into high demand professional software roles."
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Author supplied: Teaching software architecture (SA) in a bachelor computer science curriculum can be challenging, as the concepts are on a high abstraction level and not easy to grasp for students. Good techniques and tools that help with addressing the challenging SA aspects in a didactically responsible way are needed. In this tool demo we show how we used the software architecture compliance checking tool HUSACCT for addressing various concepts of SA in our courses on software architecture. The students were introduced to architectural reconstruction and architecture compliance checking, which helped them to gain important insights in aspects such as the relation between architectural models and code and the specification of dependency relations between architecture elements as concrete rules.
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In this paper we present a methodology to measure the energy consumption of software. The methodology is based on detailed monitoring of power usage of hardware components. We explain our lab setup after which we apply the methodology to different pieces of DNS resolver software. Through this case study we demonstrate some of the uses of our methodology, as it can be used to determine which software performs the tasks at hand in the most energy efficient way, what the influence of software configuration can be, etcetera.
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Betonprinten biedt veel nieuwe mogelijkheden op het gebied van productie en materiaal, maar vraagt van het MKB en startups flinke investeringen in kennis en middelen om er mee aan de slag te gaan. Met name slicer software, dat 3D modellen omzet naar printercode, vormt een bottleneck omdat deze alleen commercieel en printer-specifiek verkrijgbaar zijn. Saxion, Vertico en White Lioness willen in dit project de haalbaarheid van gratis open source slicer software die als cloud dienst wordt aangeboden onderzoeken. Deze oplossing maakt betonprinten bereikbaar voor meer innovatieve toepassingen vanuit MKB en startups, en vormt een platform voor het verzamelen en delen van kennis op het gebied van betonprinten.
Heb je wel eens gemerkt dat de premie voor je autoverzekering verandert als je in een andere wijk gaat wonen? Verzekeraars berekenen dit met een algoritme, wat kan leiden tot indirecte discriminatie. Dit project onderzoekt hoe zulke digitale differentiatie (DD) zowel eerlijk als rendabel kan.
Many lithographically created optical components, such as photonic crystals, require the creation of periodically repeated structures [1]. The optical properties depend critically on the consistency of the shape and periodicity of the repeated structure. At the same time, the structure and its period may be similar to, or substantially below that of the optical diffraction limit, making inspection with optical microscopy difficult. Inspection tools must be able to scan an entire wafer (300 mm diameter), and identify wafers that fail to meet specifications rapidly. However, high resolution, and high throughput are often difficult to achieve simultaneously, and a compromise must be made. TeraNova is developing an optical inspection tool that can rapidly image features on wafers. Their product relies on (a) knowledge of what the features should be, and (b) a detailed and accurate model of light diffraction from the wafer surface. This combination allows deviations from features to be identified by modifying the model of the surface features until the calculated diffraction pattern matches the observed pattern. This form of microscopy—known as Fourier microscopy—has the potential to be very rapid and highly accurate. However, the solver, which calculates the wafer features from the diffraction pattern, must be very rapid and precise. To achieve this, a hardware solver will be implemented. The hardware solver must be combined with mechatronic tracking of the absolute wafer position, requiring the automatic identification of fiduciary markers. Finally, the problem of computer obsolescence in instrumentation (resulting in security weaknesses) will also be addressed by combining the digital hardware and software into a system-on-a-chip (SoC) to provide a powerful, yet secure operating environment for the microscope software.
